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IQC - Incoming Quality Control

Incoming Quality Control

IC (integrated circuit) manufacturers can identify wafer material which is out of the specified range, before it causes yield loss in downstream processes.

Check for nanotopography, particles and defects, scratches and pits, as well as wafer shape and thickness before putting incoming wafer orders into the production line.

Check semiconductor wafer supplier quality and monitor ongoing supplies. The worldwide correlation capability of ADE equipment eliminates the risk of inappropriate material acceptance or rejection by integrated circuit makers.

 

 

Products for this application

NanoMapper®

WaferSight

AWIS

UltraGage®

UltraScan®

FabVision

 

Related applications

Wafer shape and thickness

Nanotopography

Particle Defect Characterization

 

 

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